MADE Workflows > Apply Failure Rate Prediction (FRP)

WF35: Apply Failure Rate Prediction (FRP)

Pre-requisites

RAM Module: access to the Reliability, Availability and Maintainability Module is required to enable Failure Rate Prediction analyses.
FBD Model: model items which are representation of items that qualify for Failure Rate Prediction analyses to be conducted.

Access 'Failure Rate Prediction' (FRP) under 'Analyses' in the main menu bar.
Create an analysis with the 'Create a new Failure Rate analysis' button along the right-hand side of the Analysis List section. Define a name, description and type for the analysis.
Select the target model item(s) to which the predicted Failure Rate / MTTF will be applied. Open the dialog via the Item(s) field that reads "Select an item," and select all relevant target components and / or parts for the FRP Analysis.
Add part via the dialog opened with the green plus icon button on the right-hand side of the 'Part List' and select from the list.
Define part details that include part description, quantity and operational factors that are specific to the selected part.
Continue until all relevant parts and their details are defined to determine the Failure Rate / MTTF for the target model item.
The failure rates of defined parts are used to determine a resultant Failure Rate / MTTF which are applied to selected model items with the 'Apply Analysis MTTF to Item(s)' button.
Failure Rate Prediction has been performed and the result applied to the model item(s).

All Parts Defined? — No → loop back to Add Part; Yes → Apply Analysis Failure Rate / MTTF to Item(s).

Step 1: Access Failure Rate Prediction

'Analyses' menu (highlighted): Fault Tree, Response Paths, Connection Matrix, Common Mode Analysis, Critical Item Analysis, Criticality & Reliability Editor, Technical Budget Analysis, Failure Rate Prediction (highlighted), Markov Analysis, RBD Analysis, Reliability Allocation Editor, Back-Fit RCM, Classic RCM, Maintenance Cost Estimates.

Step 2: Create Failure Rate Prediction Analysis

"Failure Rate Prediction" tab: left nav Overview / Management. "Analysis List" table (Analysis Name/Analysis Type/Item(s)/Failure Rate): "Last Applied" (folder), "All Others" (folder). "Analysis Summary" panel: Name, Description, Type dropdown; "Predicted Failure Rate": Item(s), Item MTTF, Analysis Failure Rate, Analysis MTTF; button "Apply Analysis MTTF to Item(s)" (disabled).
"Create a new Failure Rate Analysis" dialog: "Enter an analysis name, then select the type of analysis to perform." Name "Training Analysis", Description "For demonstration purposes.", Type "217F Notice 2 - Electronic Reliability Prediction". Buttons OK, Cancel.

Step 3: Select Target Item(s)

"Failure Rate Prediction" dialog — "Select Target Items": "Select the components or parts that this analysis should apply to." Search field. Tree (Element Name/MTTF [Hours]): Vehicle System > Coupling (1000000.00), Driveline > Differential (1000000.00), Driveshaft (1000000.00), Half Shaft Front (1000000.00), Half Shaft Rear (1000000.00), Planetary Geabox Front (1000000.00), Planetary Gearbox Rear (50.00), Transmission (1000000.00), Wheel Front (1000000.00), Wheel Rear (1000000.00), Wheel Resistance Rear (1000000.00), Wheel Resistane Front (1000000.00); Power Generation > "Control Unit" (checked/selected/highlighted, 1000000.00), Diesel Engine > Air Filter (1000000.00), Coupling 1 (1000000.00), Engine (1000000.00), Governor (1000000.00), Injector Pump (1000000.00), Lift Pump (1000000.00), Primary Fuel Filter (1000000.00). Buttons OK, Cancel.

Step 4: Add Part

"Add a new Part" dialog — "New Part": "Select or search for a part." Filter field. Tree: Logical Group (selected), Hybrid Microcircuit, Microcircuits > Gate/Logic Arrays and Microprocessors, VHSIC-Like and VLSI CMOS, VHSIC-Like and VLSI CMOS (Detailed Model), Memories > Gallium Arsenide Devices (GaAs) > Microwave Monolithic Integrated Circuit (GaAs MMIC), Digital Integrated Circuit (GaAs Digital), Surface Acoustic Wave Devices, Magnetic Bubble Memories; Discrete Semiconductors > Diodes > Diode, General Purpose Analog; Diode, Switching; Diode, Fast Recovery Power Rectifier; Diode, Power Rectifier/Schottky Power Diode; Diode, Power Rectifier with High Voltage Stacks (per junction); Diode, Transient Suppressor/Varistor; Diode, Current Regulator; Diode, Voltage Regulator and Voltage Reference (Avalanche and Zener); Diode, Si IMPATT (Frequency ≤ 35GHz); Diode, Gunn/Bulk Effect. Buttons OK, Cancel.

Step 5: Define Part Details

"Failure Rate Prediction" tab: "Predicted Failure Rate": Item(s) "Control Unit", Item MTTF "1,000,000 hours", Analysis Failure Rate "1.2106", Analysis MTTF "826,044 hours". "Part List" table (Part Name/Qty./Failure Rate): "Diode, Voltage Regulator and Voltage Reference (A..." (1, 1.211). "Part Details": Description (empty), Quantity "1". "Diode Failure Rate - λp" "1.211": Base Failure Rate - λb "Voltage Regulator and Voltage Reference (Avalanche and..." "0.002000"; Environment Factor - πE "CL - Cannon, Launch" "320.0"; Quality Factor - πQ "JANTX" "1.000"; Construction Factor - πC "Non-Metallurgically Bonded and Spring Loaded Contac..." "2.000"; "Temperature Factor - πT" "0.9458": Junction Temperature (TJ) [°C] "22.45", Case Temperature [°C] "20.0" (checkbox Default), Junction to Case Thermal Resistance - θJC [°C/W] "0.07" (checkbox Default), Device Worst Case Power Dissipation [W] "35.0".

Step 7: Apply Analysis MTTF to Item(s)

Same "*Failure Rate Prediction" (unsaved) tab: Item MTTF now "826,044 hours" (updated from 1,000,000), Analysis Failure Rate "1.2106", Analysis MTTF "826,044 hours". Button "Apply Analysis MTTF to Item(s)" highlighted. Same Part List and Part Details as Step 5.

Step 8: Failure Rate Prediction Applied

"Failure Rate Prediction" tab (saved) with same Predicted Failure Rate values. Below, "Properties" panel for "Control Unit": tabs General (selected)/Bond/Functional Failures/Technical Property/Availability/Reliability/Monte Carlo. Item Name "Control Unit", Item Number (empty), Physical Description (empty). "Logistics": LCN (empty). "Criticality Flag": checkboxes Critical Item (checked), Safety Item (unchecked), Mission Critical (unchecked), Loss of System (unchecked). "Maintainability": LRU (unchecked), SRU (unchecked), Group "None".